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• W3147299167 abstract "Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation." @default.
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• W3147299167 date "2009-01-01" @default.
• W3147299167 modified "2023-10-16" @default.
• W3147299167 title "A framework for estimating NBTI degradation of microarchitectural components" @default.
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• W3147299167 doi "https://doi.org/10.1109/aspdac.2009.4796522" @default.
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