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• W3147485083 endingPage "348" @default.
• W3147485083 startingPage "331" @default.
• W3147485083 abstract "Abstract This chapter discusses various aspects of scanning tunneling spectroscopy (STS). It is an extension of the classical tunneling spectroscopy experiment to nanometer-scale or atomic-scale features on the sample surface. First, the electronics for STS is presented. The nature of STS as a convolution of tip DOS and sample DOS is discussed. Special tip treatment for the STS experiment, often different from the atomic-resolution STM, is described. The purpose is to produce tips with flat DOS, instead of special tip orbitals. A useful data process method, the Feenstra parameter, is presented. Experimental methods to determine tip DOS is discussed. A detailed account of the inelastic scanning tunneling spectroscopy, or STM-IETS, is then discussed. It includes the principles, the electronics, and the instrumental broadening of the features. This chapter concludes with the observation of the isotope effect in STM-IETS, a definitive signature of the vibrational spectra of molecules." @default.
• W3147485083 created "2021-04-13" @default.
• W3147485083 creator A5082714140 @default.
• W3147485083 date "2007-09-01" @default.
• W3147485083 modified "2023-10-17" @default.
• W3147485083 title "Scanning Tunneling Spectroscopy" @default.
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