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- W3148472667 abstract "The challenges for ultra-low-voltage operation are reviewed from the device side. The degradations of transistor variability and subthreshold swing are the main obstacles for the ultra-low-voltage operation. A new transistor structure with fully-depleted channel is discussed as a possible solution." @default.
- W3148472667 created "2021-04-13" @default.
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- W3148472667 date "2011-08-01" @default.
- W3148472667 modified "2023-10-01" @default.
- W3148472667 title "Ultra-low-voltage operation: Device perspective" @default.
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- W3148472667 doi "https://doi.org/10.1109/islped.2011.5993605" @default.
- W3148472667 hasPublicationYear "2011" @default.
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