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- W3148536174 abstract "This paper tries to find out whether commonly used spot defect fault model is still viable for deep sub-micron (DSM) integrated circuits' test and yield model. It is believed that for DSM products spot defects may be no longer major source of yield loss. Results from number of computer experiments are presented and discussed." @default.
- W3148536174 created "2021-04-13" @default.
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- W3148536174 date "2007-04-01" @default.
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- W3148536174 title "Open Defects Caused by Scratches and Yield Modelling in Deep Sub-Micron Integrated Circuit" @default.
- W3148536174 hasPublicationYear "2007" @default.
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