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- W3149953921 abstract "Failure modes are investigated for linear integrated circuits, including op-amps that are embedded within more complex circuit functions. The specific techniques used in internal circuit design have a large impact on the radiation sensitivity of various device parameters, which makes it difficult to generalize conclusions about failure mechanisms. Loading and bias conditions can be critically important for some devices, and have a large impact on hardness assurance." @default.
- W3149953921 created "2021-04-13" @default.
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- W3149953921 date "2009-09-01" @default.
- W3149953921 modified "2023-10-18" @default.
- W3149953921 title "Failure modes and hardness assurance for linear integrated circuits in space applications" @default.
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- W3149953921 doi "https://doi.org/10.1109/radecs.2009.5994667" @default.
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