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- W3150581978 abstract "Abstract Herein, we have investigated the optical and microwave dielectric properties of Bi 0.5 Na 0.5 TiO 3 (BNT) thin films grown under different oxygen pressure ( P O2 ) using pulsed laser deposition (PLD) technique. The X-ray diffraction measurements confirms the single phase of BNT along with secondary phase and further reduction in secondary phase and increase in BNT phase with P O2 , signifies the close relation between the crystal structure and oxygen content. The shift of Raman-active TO1, TO2 and TO3 modes towards higher wavelengths and increase in mode intensity with P O2 indicating the films degree of crystallinity. The local roughness ( α loc ) of all films obtained as ~ 0.85, and the interface width ( w ) and lateral correlation length ( ξ ) of films varies with P O2 . Also, the films exhibit the increase in refractive index and reduction in optical bandgap of due to improvement in crystallinity and reduction in the oxygen vacancies. The microwave dielectric properties show a strong P O2 depends with higher dielectric constant ( ε r = 336) with lower loss (tan δ = 0.0093) at 5 GHz which show the potential applications in high frequency devices." @default.
- W3150581978 created "2021-04-13" @default.
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- W3150581978 date "2021-03-18" @default.
- W3150581978 modified "2023-10-16" @default.
- W3150581978 title "Investigation of Surface Scaling, Optical and Microwave Dielectric Studies of Bi0.5Na0.5TiO3 thin Films" @default.
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- W3150581978 doi "https://doi.org/10.21203/rs.3.rs-332237/v1" @default.
- W3150581978 hasPublicationYear "2021" @default.
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