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- W3151143049 abstract "This paper presents the design and results of first measurements of a fast binary readout architecture ASIC aimed for digital X-ray imaging. The ASIC called DEDIX includes 64 readout channels, a number of DACs for different bias and threshold settings, voltage reference, temperature sensor circuit, calibration circuit, I/O circuit and a control logic circuit. Each readout channel consists of charge amplifier, PZC circuit, shaper, two discriminators and two 20-bit counters. The DEDIX is supposed to work in a relatively complex systems featuring several hundred detector channels. For this reason particular attention was paid to general system solutions and the circuit testability. This paper is essentially dedicated to these aspects of DEDIX operation. The circuit was implemented in a 3.3 V 0.35 µm CMOS technology. First tests confirm full functionality of the ASIC. Digital X-ray imaging systems containing multi-element sensors and multichannel readout ASICs are very promis- ing alternatives to traditional approaches in fields of med- ical imaging or diffractometry. A standard diffracto- metric system works with one channel sensor, so using the multichannel system could significantly shorten the measurement time keeping other important parameters at comparable level. In medical imaging more important are other advantages of digital system like its post-processing capability, large dynamics range, good spatial resolution and high counting rate (1, 2). In this paper we describe the design and first measure- ments of a new readout ASIC (called DEDIX) for digi- tal X-ray imaging. A core of such ASIC determining its critical parameters is an analogue front-end electronics. However in a system consisting of a number of ASICs the additional subcircuits like control logic, counters, DACs, internal calibration circuit etc., integrated with the ana- logue front-end in one micro structure are on the same level of importance. Moreover, from the testability and utility point of view these additional parts are the most important blocks of the ASIC. This paper concentrates on these DEDIX blocks. In the first section the DEDIX architecture is described. In the second section we report on the results of first DEDIX measurements." @default.
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- W3151143049 date "2006-01-01" @default.
- W3151143049 modified "2023-09-24" @default.
- W3151143049 title "DESIGN, FUNCTIONALITY AND TESTABILITY OF A MULTI- CHANNEL ASIC FOR DIGITAL X-RAY IMAGING" @default.
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