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- W3151202594 abstract "Abstruct - Circuit internal test techniques working in a contactless manner are necessary for failure analysis and design verification of high-speed and high-frequency circuits. A relative new technique is the Scanning Probe Voltage Measurement technique, a technique which is based on scanning probe microscopy. This paper gives an overview of the state-of-the-art of this technique and demonstrates some practical examples." @default.
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- W3151202594 date "2002-01-01" @default.
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- W3151202594 title "Contactless probing of high-frequency electrical signals with scanning probe microscopy" @default.
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