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• W3157243312 abstract "Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models won the Image Net Large Scale Visual Recognition Contest, it proved that this area of research is of great potential. Furthermore, these increases in recognition performance resulted in more applied research and thus, more applications where deeplearning is useful: one of which is defect detection (or visual defect detection). In the last few years, deeplearning models achieved higher and higher accuracy on the complex testing datasets used for benchmarking. This surge in accuracy and usage is also supported (besides swarms of researchers pouring into the race), by incremental breakthroughs in computing hardware: such as more powerful GPUs(Graphical processing units), CPUs(central processing units) and better computing procedures (libraries and frameworks).To offer a structured and analytical overview(stating both advantages and disadvantages) of the existing popular object detection models that can be re-purposed for defect detection: such as Region based CNNs(Convolutional neural networks), YOLO(You only look once), SSD(single shot detectors) and cascaded architectures. A further brief summary on model compression and acceleration techniques that enabled the portability of deeplearning detection models is included.It is of great use for future developments in the manufacturing industry that many of the popular, above mentioned models are easy to re-purpose for defect detection and, thus could really contribute to the overall increase in productivity of this sector. Moreover, in the experiment performed the YOLOv4 model was trained and re-purposed for industrial cable detection in several hours. The computing needs could be fulfilled by a general purpose computer or by a high-performance desktop setup, depending on the specificity of the application. Hence, the barrier of computing shall be somewhat easier to climb for all types of businesses." @default.
• W3157243312 created "2021-05-10" @default.
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• W3157243312 date "2022-01-01" @default.
• W3157243312 modified "2023-10-18" @default.
• W3157243312 title "A review on modern defect detection models using DCNNs – Deep convolutional neural networks" @default.
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• W3157243312 doi "https://doi.org/10.1016/j.jare.2021.03.015" @default.
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