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• W3158371116 abstract "A comparative study is carried out to clarify the energy distribution of traps under hot carrier degradation (HCD) and negative bias temperature instability (NBTI) in short channel p-FinFETs. Two sources of traps, pre-existing traps and generated traps, are identified and their energy profiles are separated using Discharging-based Multi-pulse (DMP) method. The pre-existing traps are located below valance band of silicon (Ev), while the two generated traps are located in 0.4eV above E <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>v</sub> and near conduction band (E <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>c</sub> ) of silicon, respectively. The two generated traps are highly sensitive to stress voltage and stress time under NBTI and HCD, however, the generated trap 1 is more sensitive to stress temperature than generated trap 2 under HCD. When switching to long channel devices, the overall degradation is reduced due to less trap generation." @default.
• W3158371116 created "2021-05-10" @default.
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• W3158371116 date "2021-03-01" @default.
• W3158371116 modified "2023-10-02" @default.
• W3158371116 title "Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs" @default.
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• W3158371116 doi "https://doi.org/10.1109/irps46558.2021.9405162" @default.
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