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• W3194879904 abstract "Temperature sensitive electrical parameter (TSEP) approaches are widely employed in the junction temperature ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>$T_{j}$ </tex-math></inline-formula> ) detection and prediction of power devices, especially the switching parameter. In this article, the voltage-rise time and its loss during the turn-off process are used as the TSEP index for the detection of junction temperature because of the coupling relationship with the maximum junction temperature. In addition, the effect of junction temperature on the current-fall time and its loss is compared. The theoretical analysis is verified by SABER simulation and H-bridge inverter circuit platform. It is established that the model based on voltage-rise time ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>$t_{mathrm {rv}}$ </tex-math></inline-formula> ) and voltage-rise loss ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>$E_{mathrm {rv}}$ </tex-math></inline-formula> ) is a viable model with good linearity, fixed sensitivity, and offers nondestructive insulated gate bipolar translator (IGBT) junction temperature extraction." @default.
• W3194879904 created "2021-08-30" @default.
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• W3194879904 date "2021-09-01" @default.
• W3194879904 modified "2023-09-23" @default.
• W3194879904 title "On the Junction Temperature Extraction Approach With a Hybrid Model of Voltage-Rise Time and Voltage-Rise Loss" @default.
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• W3194879904 doi "https://doi.org/10.1109/tcpmt.2021.3104586" @default.
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