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- W3199608916 abstract "This chapter describes two important methods based on the absorption of X-rays and which represent very powerful tools for the characterization of metal oxide nanoparticles in powders, colloidal suspensions, and sols. It introduces the methods, that is, X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) and outlines their basic physicochemical principles, standard analysis procedures, as well as the equipment required. XPS is a well-established and versatile surface-sensitive method which is based on the energy analysis of photoelectrons emitted from a gaseous sample or from the surface of a solid sample irradiated by X-rays. Ultraviolet photoemission spectroscopy is a powerful tool for the investigation of the electronic structure of the surface states. Due to their complementarity and to the nature of the information provided by the two methods, XPS and XAS are often used in combination to unveil the complex nature of metal oxide nanoparticle systems." @default.
- W3199608916 created "2021-09-27" @default.
- W3199608916 creator A5067999085 @default.
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- W3199608916 date "2021-09-12" @default.
- W3199608916 modified "2023-10-18" @default.
- W3199608916 title "Electronic and Chemical Properties: X‐Ray Absorption and Photoemission" @default.
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- W3199608916 doi "https://doi.org/10.1002/9781119436782.ch11" @default.
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