FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W3202330845> ?p ?o ?g. }

• W3202330845 endingPage "880" @default.
• W3202330845 startingPage "876" @default.
• W3202330845 abstract "The poor interface quality of the Silicon Carbide/oxide (SiC/SiO2) interface severely degrades the electron surface channel mobility in SiC-based power devices. Based on transfer characteristic simulations (with a deck calibrated to experimental data), this work predicts improved mobility with stress engineering, a well-established technique for performance enhancement in low power silicon (Si) transistor technology. Process simulation of Si and SiC-based devices with Silicon Nitride (Si3N4) stressor layer has been carried out to estimate the stress generated in the channel. SiC D-MOSFET We have also computed the effect of varying stress magnitude, direction, and position in the device." @default.
• W3202330845 created "2021-10-11" @default.
• W3202330845 creator A5024897315 @default.
• W3202330845 creator A5055626238 @default.
• W3202330845 creator A5076966798 @default.
• W3202330845 date "2021-01-01" @default.
• W3202330845 modified "2023-09-27" @default.
• W3202330845 title "Stress Engineering for Drive Current Enhancement in Silicon Carbide (SiC) Power MOSFETs" @default.
• W3202330845 cites W1823724229 @default.
• W3202330845 cites W1975768646 @default.
• W3202330845 cites W1977444840 @default.
• W3202330845 cites W1994542341 @default.
• W3202330845 cites W1996759979 @default.
• W3202330845 cites W2026529507 @default.
• W3202330845 cites W2037516832 @default.
• W3202330845 cites W2057406984 @default.
• W3202330845 cites W2082892031 @default.
• W3202330845 cites W2087182146 @default.
• W3202330845 cites W2087406528 @default.
• W3202330845 cites W2091246468 @default.
• W3202330845 cites W2108830266 @default.
• W3202330845 cites W2113875468 @default.
• W3202330845 cites W2113990904 @default.
• W3202330845 cites W2117482878 @default.
• W3202330845 cites W2118294059 @default.
• W3202330845 cites W2122915710 @default.
• W3202330845 cites W2127407240 @default.
• W3202330845 cites W2129372633 @default.
• W3202330845 cites W2145117826 @default.
• W3202330845 cites W2146753314 @default.
• W3202330845 cites W2164140967 @default.
• W3202330845 cites W2290322225 @default.
• W3202330845 cites W2499422801 @default.
• W3202330845 cites W2523318108 @default.
• W3202330845 cites W2536792177 @default.
• W3202330845 cites W2543985255 @default.
• W3202330845 cites W2725017948 @default.
• W3202330845 cites W2766106330 @default.
• W3202330845 cites W2766796456 @default.
• W3202330845 cites W2770675786 @default.
• W3202330845 cites W2782922314 @default.
• W3202330845 cites W2921249629 @default.
• W3202330845 cites W2972819222 @default.
• W3202330845 cites W3005440385 @default.
• W3202330845 cites W3049768510 @default.
• W3202330845 cites W3132216707 @default.
• W3202330845 cites W629861200 @default.
• W3202330845 doi "https://doi.org/10.1109/jeds.2021.3116098" @default.
• W3202330845 hasPublicationYear "2021" @default.
• W3202330845 type Work @default.
• W3202330845 sameAs 3202330845 @default.
• W3202330845 citedByCount "1" @default.
• W3202330845 countsByYear W32023308452023 @default.
• W3202330845 crossrefType "journal-article" @default.
• W3202330845 hasAuthorship W3202330845A5024897315 @default.
• W3202330845 hasAuthorship W3202330845A5055626238 @default.
• W3202330845 hasAuthorship W3202330845A5076966798 @default.
• W3202330845 hasBestOaLocation W32023308451 @default.
• W3202330845 hasConcept C106782819 @default.
• W3202330845 hasConcept C119599485 @default.
• W3202330845 hasConcept C127413603 @default.
• W3202330845 hasConcept C129014197 @default.
• W3202330845 hasConcept C138885662 @default.
• W3202330845 hasConcept C159985019 @default.
• W3202330845 hasConcept C165801399 @default.
• W3202330845 hasConcept C172385210 @default.
• W3202330845 hasConcept C189278905 @default.
• W3202330845 hasConcept C192562407 @default.
• W3202330845 hasConcept C21036866 @default.
• W3202330845 hasConcept C2777431650 @default.
• W3202330845 hasConcept C2778413303 @default.
• W3202330845 hasConcept C2780722187 @default.
• W3202330845 hasConcept C41895202 @default.
• W3202330845 hasConcept C49040817 @default.
• W3202330845 hasConcept C544956773 @default.
• W3202330845 hasConcept C61696701 @default.
• W3202330845 hasConcept C88653102 @default.
• W3202330845 hasConceptScore W3202330845C106782819 @default.
• W3202330845 hasConceptScore W3202330845C119599485 @default.
• W3202330845 hasConceptScore W3202330845C127413603 @default.
• W3202330845 hasConceptScore W3202330845C129014197 @default.
• W3202330845 hasConceptScore W3202330845C138885662 @default.
• W3202330845 hasConceptScore W3202330845C159985019 @default.
• W3202330845 hasConceptScore W3202330845C165801399 @default.
• W3202330845 hasConceptScore W3202330845C172385210 @default.
• W3202330845 hasConceptScore W3202330845C189278905 @default.
• W3202330845 hasConceptScore W3202330845C192562407 @default.
• W3202330845 hasConceptScore W3202330845C21036866 @default.
• W3202330845 hasConceptScore W3202330845C2777431650 @default.
• W3202330845 hasConceptScore W3202330845C2778413303 @default.
• W3202330845 hasConceptScore W3202330845C2780722187 @default.
• W3202330845 hasConceptScore W3202330845C41895202 @default.
• W3202330845 hasConceptScore W3202330845C49040817 @default.
• W3202330845 hasConceptScore W3202330845C544956773 @default.
• W3202330845 hasConceptScore W3202330845C61696701 @default.
• W3202330845 hasConceptScore W3202330845C88653102 @default.
• W3202330845 hasLocation W32023308451 @default.
• W3202330845 hasOpenAccess W3202330845 @default.

• next