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- W3203768142 abstract "Extensive application of electron holography to electric field analysis in various functional materials is described. As one of the most basic applications of electron holography, first measurement of the mean inner potential with diamond-like carbon, SiO 2 particles, and p–n junctions is presented. Then, electric field analysis of precipitates in multilayer ceramic capacitor is explained. In oxide heterojunctions, spontaneous polarization can be quantitatively analyzed. Electric field change due to the charge distribution change is observed with laser irradiation. With a Ag-based conductive adhesive, analysis and interpretation of conductivity with microstructure changes is carried out with simulation. Detection of electric field variation around various field emitters is also presented." @default.
- W3203768142 created "2021-10-11" @default.
- W3203768142 creator A5068901104 @default.
- W3203768142 date "2022-09-02" @default.
- W3203768142 modified "2023-09-26" @default.
- W3203768142 title "Electric Field Analysis" @default.
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- W3203768142 doi "https://doi.org/10.1002/9783527829712.ch7" @default.
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