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• W3204417074 abstract "We show in random matrix theory, microwave measurements, and computer simulations that the mean free path of a random medium and the strength and position of an embedded reflector can be determined from radiation scattered by the system. The mean free path and strength of the reflector are determined from the statistics of transmission. The statistics of transmission are independent of the position of the reflector. The reflector's position can be found, however, from the average dwell time for waves incident from one side of the sample." @default.
• W3204417074 created "2021-10-11" @default.
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• W3204417074 date "2021-09-29" @default.
• W3204417074 modified "2023-10-01" @default.
• W3204417074 title "Characterizing random one-dimensional media with an embedded reflector via scattered waves" @default.
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• W3204417074 doi "https://doi.org/10.1103/physrevb.104.104204" @default.
• W3204417074 hasPublicationYear "2021" @default.
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