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- W3206162011 abstract "A high-performance and low power consumption triple-node upset self-recoverable latch (HTNURL) is proposed. It can effectively tolerate single-node upset (SNU), double-node upset (DNU), and triple-node upset (TNU). This latch uses the C-element to construct a feedback loop, which reduces the delay and power consumption by fast path and clock gating techniques. Compared with the TNU-recoverable latches, HTNURL has a lower delay, reduced power consumption, and full self-recoverability. The delay, power consumption, area overhead, and area-power-delay product (APDP) of the HTNURL is reduced by 33.87%, 63.34%, 21.13%, and 81.71% on average." @default.
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- W3206162011 date "2021-10-10" @default.
- W3206162011 modified "2023-09-27" @default.
- W3206162011 title "HTNURL: Design of a High-Performance Low-Cost Triple-Node Upset Self-Recoverable Latch" @default.
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- W3206162011 doi "https://doi.org/10.3390/electronics10202457" @default.
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