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Matches in SemOpenAlex for { <https://semopenalex.org/work/W3207564309> ?p ?o ?g. }

• W3207564309 endingPage "114275" @default.
• W3207564309 startingPage "114275" @default.
• W3207564309 abstract "Variations in the operational behavior of seemingly identical transistors pose a remarkable challenge for application engineers as integrated circuits have to be designed to be resilient against process and aging-related error sources. In small-area transistors, electrically active defects give rise to considerable device-to-device variations for instance of the threshold voltage. With the ongoing reduction of device dimensions, the impact of a single-defect becomes more and more relevant for the device behavior. While in circuit simulations, typically changes of mean values are considered, we thoroughly investigate the impact of variations of defect distributions on the signal propagation delay of an inverter circuit from the perspective of single oxide and interface defects. For this, the charge trapping kinetics of each defect is described using our stochastic charge trapping model. The impact of these single defects on the device behavior is extracted from detailed experimental studies. We demonstrate that the variation of the defect distributions between devices can lead to a signal propagation delay of several picoseconds for an inverter circuit. This can become a critical issue for circuits employing nanoscale transistors intended to operate at several hundreds of megahertz." @default.
• W3207564309 created "2021-10-25" @default.
• W3207564309 creator A5008613051 @default.
• W3207564309 creator A5027809107 @default.
• W3207564309 creator A5060130885 @default.
• W3207564309 creator A5062594496 @default.
• W3207564309 creator A5063596208 @default.
• W3207564309 creator A5067730274 @default.
• W3207564309 creator A5077464890 @default.
• W3207564309 creator A5084749665 @default.
• W3207564309 creator A5088631482 @default.
• W3207564309 creator A5090077113 @default.
• W3207564309 date "2021-11-01" @default.
• W3207564309 modified "2023-10-05" @default.
• W3207564309 title "Impact of single-defects on the variability of CMOS inverter circuits" @default.
• W3207564309 cites W1987145716 @default.
• W3207564309 cites W2004090555 @default.
• W3207564309 cites W2010906761 @default.
• W3207564309 cites W2032144594 @default.
• W3207564309 cites W2037328774 @default.
• W3207564309 cites W2065851146 @default.
• W3207564309 cites W2106482808 @default.
• W3207564309 cites W2131947274 @default.
• W3207564309 cites W2141899849 @default.
• W3207564309 cites W2160188535 @default.
• W3207564309 cites W2504241152 @default.
• W3207564309 cites W2604267102 @default.
• W3207564309 cites W2802502993 @default.
• W3207564309 cites W2805585035 @default.
• W3207564309 cites W2920836843 @default.
• W3207564309 cites W3018082668 @default.
• W3207564309 cites W3042625301 @default.
• W3207564309 cites W3186878565 @default.
• W3207564309 doi "https://doi.org/10.1016/j.microrel.2021.114275" @default.
• W3207564309 hasPublicationYear "2021" @default.
• W3207564309 type Work @default.
• W3207564309 sameAs 3207564309 @default.
• W3207564309 citedByCount "1" @default.
• W3207564309 countsByYear W32075643092023 @default.
• W3207564309 crossrefType "journal-article" @default.
• W3207564309 hasAuthorship W3207564309A5008613051 @default.
• W3207564309 hasAuthorship W3207564309A5027809107 @default.
• W3207564309 hasAuthorship W3207564309A5060130885 @default.
• W3207564309 hasAuthorship W3207564309A5062594496 @default.
• W3207564309 hasAuthorship W3207564309A5063596208 @default.
• W3207564309 hasAuthorship W3207564309A5067730274 @default.
• W3207564309 hasAuthorship W3207564309A5077464890 @default.
• W3207564309 hasAuthorship W3207564309A5084749665 @default.
• W3207564309 hasAuthorship W3207564309A5088631482 @default.
• W3207564309 hasAuthorship W3207564309A5090077113 @default.
• W3207564309 hasBestOaLocation W32075643091 @default.
• W3207564309 hasConcept C11190779 @default.
• W3207564309 hasConcept C119599485 @default.
• W3207564309 hasConcept C127413603 @default.
• W3207564309 hasConcept C134146338 @default.
• W3207564309 hasConcept C165801399 @default.
• W3207564309 hasConcept C172385210 @default.
• W3207564309 hasConcept C192562407 @default.
• W3207564309 hasConcept C24326235 @default.
• W3207564309 hasConcept C41008148 @default.
• W3207564309 hasConcept C46362747 @default.
• W3207564309 hasConcept C49040817 @default.
• W3207564309 hasConcept C530198007 @default.
• W3207564309 hasConcept C90806461 @default.
• W3207564309 hasConceptScore W3207564309C11190779 @default.
• W3207564309 hasConceptScore W3207564309C119599485 @default.
• W3207564309 hasConceptScore W3207564309C127413603 @default.
• W3207564309 hasConceptScore W3207564309C134146338 @default.
• W3207564309 hasConceptScore W3207564309C165801399 @default.
• W3207564309 hasConceptScore W3207564309C172385210 @default.
• W3207564309 hasConceptScore W3207564309C192562407 @default.
• W3207564309 hasConceptScore W3207564309C24326235 @default.
• W3207564309 hasConceptScore W3207564309C41008148 @default.
• W3207564309 hasConceptScore W3207564309C46362747 @default.
• W3207564309 hasConceptScore W3207564309C49040817 @default.
• W3207564309 hasConceptScore W3207564309C530198007 @default.
• W3207564309 hasConceptScore W3207564309C90806461 @default.
• W3207564309 hasFunder F4320309617 @default.
• W3207564309 hasFunder F4320323031 @default.
• W3207564309 hasFunder F4320323591 @default.
• W3207564309 hasFunder F4320327593 @default.
• W3207564309 hasLocation W32075643091 @default.
• W3207564309 hasLocation W32075643092 @default.
• W3207564309 hasOpenAccess W3207564309 @default.
• W3207564309 hasPrimaryLocation W32075643091 @default.
• W3207564309 hasRelatedWork W1506367252 @default.
• W3207564309 hasRelatedWork W1690545432 @default.
• W3207564309 hasRelatedWork W1817913304 @default.
• W3207564309 hasRelatedWork W1986914234 @default.
• W3207564309 hasRelatedWork W2022301622 @default.
• W3207564309 hasRelatedWork W2081082331 @default.
• W3207564309 hasRelatedWork W2742985114 @default.
• W3207564309 hasRelatedWork W2904496513 @default.
• W3207564309 hasRelatedWork W3199501896 @default.
• W3207564309 hasRelatedWork W98453623 @default.
• W3207564309 hasVolume "126" @default.
• W3207564309 isParatext "false" @default.
• W3207564309 isRetracted "false" @default.

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