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• W3208274181 abstract "Reflection type measurements were performed on narrow-gap semiconductors such as InSb and InAs bulk samples for harmonic generation using intense terahertz pulses from free electron laser. We successfully measured the characteristic azimuthal angle dependence of the third harmonic generation (THG). The results show cos3θ and cos6θ dependence at different polarization layouts for InAs(111)." @default.
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• W3208274181 date "2021-08-29" @default.
• W3208274181 modified "2023-10-06" @default.
• W3208274181 title "Measurement of the Azimuthal Angle Dependence of Third Harmonic Generation from Narrow-gap Semiconductor Surfaces" @default.
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• W3208274181 doi "https://doi.org/10.1109/irmmw-thz50926.2021.9567243" @default.
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