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- W3213388949 abstract "Hackathons are time-bound collaborative computer science competitions increasingly popular at undergraduate institutions. It is often claimed that their failure-friendly environment helps students become better computer scientists. The same features which encourage risk-taking, however, may increase imposter syndrome and stereotype threat. Furthermore, if hackathons really do radically celebrate emergent projects, why do so many participants leave without showcasing their work? This work addresses two research questions: 1) Do students consider hackathons as a space which is safe for taking risks and learning through failure? And 2) How does participants’ perception of risk affect their decisions to persist or quit the main event competition? Extensive mixed methods data was collected from student attendees, professors, and industry sponsors of three undergraduate computer science hackathons. Constructionism was used to understand participant learning through making in a failure-friendly environment, and social cognitive career theory was used to determine how risk affects decisions on continued participation. Results showed participants largely felt that risk was good for learning, although they did worry about their classwork, health, meeting their own standards, and public embarrassment. They felt much more free to take risks than in their CS classes, and wanted 60% of the skills they used to be new. External conflicts or an unfinished project were the reasons that half of participants didn’t submit for judging. As almost 80% of hackathon attendees have CS related majors, these findings have implications for how risks can be productively used for learning both at hackathons and CS classes." @default.
- W3213388949 created "2021-11-22" @default.
- W3213388949 creator A5055643940 @default.
- W3213388949 date "2021-11-18" @default.
- W3213388949 modified "2023-09-29" @default.
- W3213388949 title "“Learning from mistakes is the best thing”: Risk and Persistence at Hackathons" @default.
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- W3213388949 doi "https://doi.org/10.1145/3488042.3490175" @default.
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