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- W3216566023 abstract "In this letter, a 1-thru deembedding method for one-port microwave device characterization is presented. Only one standard “thru” is used in the proposed deembedding process. Reliable device models can be developed by the proposed method for EM/circuit cosimulation. The proposed method is verified by the deembedding process of a surface-mount p-i-n diode. Furthermore, the deembedded results are utilized in the EM/circuit cosimulation of a reconfigurable filter. The reconfigurable filter is fabricated and measured for verification. Good agreement is achieved between the experimental and simulated results." @default.
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- W3216566023 date "2022-04-01" @default.
- W3216566023 modified "2023-09-27" @default.
- W3216566023 title "1-Thru Deembedding Method for One-Port Microwave Device Characterization" @default.
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- W3216566023 doi "https://doi.org/10.1109/lmwc.2021.3128251" @default.
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