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- W33129413 abstract "Commercial microcontrollers--monolithic integrated circuits containing microprocessor, memory and various peripheral functions--such as are used in industrial, automotive and military applications, present spacecraft avionics system designers an appealing mix of higher performance and lower power together with faster system-development time and lower unit costs. However, these parts are not radiation-hardened for application in the space environment and Single-Event Effects (SEE) caused by high-energy, ionizing radiation present a significant challenge. Mitigating these effects with techniques which require minimal additional support logic, and thereby preserve the high functional density of these devices, can allow their benefits to be realized.This dissertation uses fault-tolerance to mitigate the transient errors and occasional latchups that non-hardened microcontrollers can experience in the space radiation environment. Space systems requirements and the historical use of fault-tolerant computers in spacecraft provide context. Space radiation and its effects in semiconductors define the fault environment. A reference architecture is presented which uses two or three microcontrollers with a combination of hardware and software voting techniques to mitigate SEE. A prototypical spacecraft function (an inertial measurement unit) is used to illustrate the techniques and to explore how real application requirements impact the fault-tolerance approach. Low-cost approaches which leverage features of existing commercial microcontrollers are analyzed. A high-speed serial bus is used for voting among redundant devices and a novel wire-OR output voting scheme exploits the bidirectional controls of I/O pins.A hardware testbed and prototype software were constructed to evaluate two- and three-processor configurations. Simulated Single-Event Upsets (SEUs) were injected at high rates and the response of the system monitored. The resulting statistics were used to evaluate technical effectiveness. Fault-recovery probabilities (coverages) higher than 99.99% were experimentally demonstrated. The greater than thousand-fold reduction in observed effects provides performance comparable with SEE tolerance of tested, rad-hard devices. Technical results were combined with cost data to assess the cost-effectiveness of the techniques. It was found that a three-processor system was only marginally more effective than a two-device system at detecting and recovering from faults, but consumed substantially more resources, suggesting that simpler configurations are generally more cost-effective." @default.
- W33129413 created "2016-06-24" @default.
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- W33129413 date "1998-01-01" @default.
- W33129413 modified "2023-09-23" @default.
- W33129413 title "Minimalist fault-tolerance techniques for mitigating single-event effects in non-radiation-hardened microcontrollers" @default.
- W33129413 hasPublicationYear "1998" @default.
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