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- W36161254 abstract "This chapter provides a brief overview of Raman scattering in semiconductors. The large amount of experimental information on these materials is reviewed from the perspective of the latest theoretical advances, and detailed expressions are given that should allow the reader to compute Raman spectra and to compare theoretical cross sections with experimental photon counts. Applications of Raman spectroscopy to measurements of crystal orientation, temperature, stress, impurities and alloying are succinctly reviewed, with emphasis on the principles underlying these applications and on the scope and limitations of the information that can be obtained with Raman spectroscopy." @default.
- W36161254 created "2016-06-24" @default.
- W36161254 creator A5037771693 @default.
- W36161254 date "2000-01-01" @default.
- W36161254 modified "2023-10-18" @default.
- W36161254 title "Characterization of Bulk Semiconductors Using Raman Spectroscopy" @default.
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- W36161254 doi "https://doi.org/10.1007/978-3-662-04221-2_3" @default.
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