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- W41244032 abstract "The quartz vacuum microbalance procedure for sputtering yield measurement has been modified to allow the continuous and absolute determination of sputtering yields in the threshold region. Details of the method are presented. The applicability of the technique has been demonstrated in a study of the argon ion bombardment of single crystal copper in the 30–100 ev range. The absolute dynamic microbalance method is theoretically sound and has no serious experimental limitations." @default.
- W41244032 created "2016-06-24" @default.
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- W41244032 date "1967-01-01" @default.
- W41244032 modified "2023-09-25" @default.
- W41244032 title "Dynamic absolute sputtering yield measurement in the threshold region" @default.
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- W41244032 doi "https://doi.org/10.1016/b978-0-08-012127-7.50019-4" @default.
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