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- W41570003 abstract "In this paper the problems of modelling nMOS LSI/VLSI circuits and of their physical faults, as well as fault detection in these circuits are considered from a new perspective, Petri nets have been used as the modelling tool. This paper describes a method of modelling MOS circuits with the help of Petri nets, as well as of modelling classical (stuck-at and bridging faults) and nonclassical faults?, by means of Petri nets. The nonclassical faults change the structure of MOS cells and are characteristic of MOS LSI technology. The problem of detecting all types of physical failures has also been considered. The correct and faulty Petri nets models of the circuit are the starting point of the process of test generation procedures. The test sets generated in this way detects all detectable single and multiple faults." @default.
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- W41570003 date "1987-01-01" @default.
- W41570003 modified "2023-09-26" @default.
- W41570003 title "Petri Nets Approach to Modelling and Logical Fault Detection of MOS LSI Circuits" @default.
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- W41570003 doi "https://doi.org/10.1016/b978-0-08-034922-0.50036-4" @default.
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