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- W41971265 abstract "A graphical representation describes the effects of iongterm vacuum ( approximates 10/sup -6/mm Hg for 6 mo) on commercially available Si radiation detectors of two types: surface barrier, which are manufactured from n-type single crystal Si and diffused junction, which are manufactured from ptype single crystal Si. Data include measurements of alpha resolution, dead layer or window thickness, RMS noise voltage, reverse ieakage current and pulse height stability at rated voltage. A summary of radiation damage on semiconductor materials and devices is included. (auth)" @default.
- W41971265 created "2016-06-24" @default.
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- W41971265 date "1962-05-26" @default.
- W41971265 modified "2023-09-27" @default.
- W41971265 title "EFFECTS OF LONG TERM VACUUM ON COMMERCIAL SILICON RADIATION DETECTORS" @default.
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