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- W4200070005 abstract "In this paper we investigate the influence of trap filling conditions on the extraction of the emission time constant (τ) of deep levels associated with Fe doping in AlGaN/GaN HEMTs. To this end, we monitor the drain current transients (DCTs) after a short (1 μs) trap filling pulse and investigate the effect of varying (i) gate voltage (V<inf>GS,fill</inf>) and (ii) drain voltage (V<inf>DS,fill</inf>) applied during the filling pulse. We find that the extracted τ weakly depends on V<inf>GS,fill</inf> and it decreases for V<inf>DS,fill</inf> below 40 V; instead, for V<inf>DS,fill</inf> > 40 V τ saturates to a value corresponding to the inverse of the emission rate (1/e<inf>n</inf>) at room temperature. The decrease of τ with decreasing V<inf>DS,fill</inf> was explained with the aid of numerical simulations, by attributing it to the concurrent effect of both emission and capture processes during DCT. This dependence must be taken into account when using DCT to characterize trap emission dynamics in order to correctly estimate the capture cross-section from Arrhenius plots." @default.
- W4200070005 created "2021-12-31" @default.
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- W4200070005 date "2021-11-07" @default.
- W4200070005 modified "2023-10-16" @default.
- W4200070005 title "Effect of Trap-Filling Bias on the Extraction of the Time Constant of Drain Current Transients in AlGaN/GaN HEMTs" @default.
- W4200070005 doi "https://doi.org/10.1109/wipda49284.2021.9645115" @default.
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