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• W4200084282 abstract "Molybdenum disulfide (MoS2) polycrystalline thin films of different thicknesses have been deposited by radio frequency magnetron sputtering and then post-annealed. The resonant and non-resonant Raman spectra consist of broadened, insignificantly shifted peaks, pointing out that the atomic structure of MoS2 in thin films is preserved. X-ray diffraction and high-resolution transmission electron microscopy suggest that the mean crystallite size of MoS2 thin films ranges from 2.8 to 4.2 nm with increasing film thickness. The blue shift in the optical absorption spectra with the decreasing mean crystallite size and decreasing layer thickness provides tailorability of the bandgap. The increase in the effective bandgap from 1.6 to 1.9 eV is apparent with the reduction in film thickness from 24 to 1.5 nm. It can be seen that even for thick films, whose thickness can be compared to the bulk sample, the value of the effective bandgap is higher than 1.2 eV, as reported for bulk MoS2. It is presumed that this effect could be attributed to the quantum size effect exerted by two types of energy barriers: grain boundaries and layer surfaces. The experimentally measured bandgap of MoS2 thin films is compared with the predictions of the effective mass approximation and the hyperbolic band approximation models for the crystallites building up the films." @default.
• W4200084282 created "2021-12-31" @default.
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• W4200084282 date "2021-12-14" @default.
• W4200084282 modified "2023-10-01" @default.
• W4200084282 title "Spectral properties of polycrystalline MoS2 films grown by RF magnetron sputtering" @default.
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• W4200084282 doi "https://doi.org/10.1063/5.0067469" @default.
• W4200084282 hasPublicationYear "2021" @default.
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