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- W4200394663 abstract "This paper reports two failure modes and degradation mechanism of normally-on AlGaN/GaN HEMTs of 0.15 μm gate length with Pt/Au metallization scheme providing stable Schottky contact. Results describe the device performance and final degradation under reverse bias off-state stressing at high V <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>DS</inf> (up to 145 V) and stressing at elevated temperatures (up to 125 °C). Electrical stressing combined with microstructural diagnostic characterization confirms two microstructural failure modes. The first failure mode is observed as a local breakdown between gate head and source ohmic contact due to electrical overstress (EOS) causing electro-thermally induced material degradation. The second failure mode, seen also under different stress conditions, consists in pit formation at both gate edges, which is caused by stress induced local oxidation of the semiconductor surface. The first failure mode is related to a local breakdown of the nitride / oxide insulator in correlation with sudden increase of the device currents. The second failure mode causes local distortion of the 2-dimentional electron gas (2DEG) and partial degradation of the Schottky contact." @default.
- W4200394663 created "2021-12-31" @default.
- W4200394663 creator A5002653396 @default.
- W4200394663 creator A5009696592 @default.
- W4200394663 creator A5013541996 @default.
- W4200394663 creator A5021870329 @default.
- W4200394663 creator A5027748782 @default.
- W4200394663 creator A5033707390 @default.
- W4200394663 creator A5060691200 @default.
- W4200394663 creator A5064109540 @default.
- W4200394663 creator A5073915516 @default.
- W4200394663 creator A5079710213 @default.
- W4200394663 creator A5083143279 @default.
- W4200394663 creator A5084844277 @default.
- W4200394663 date "2021-11-07" @default.
- W4200394663 modified "2023-10-17" @default.
- W4200394663 title "Microstructural Degradation Investigations of OFF-State Stressed 0.15 μm RF AlGaN/GaN HEMTs: Failure Mode related Breakdown" @default.
- W4200394663 doi "https://doi.org/10.1109/wipda49284.2021.9645151" @default.
- W4200394663 hasPublicationYear "2021" @default.
- W4200394663 type Work @default.
- W4200394663 citedByCount "0" @default.
- W4200394663 crossrefType "proceedings-article" @default.
- W4200394663 hasAuthorship W4200394663A5002653396 @default.
- W4200394663 hasAuthorship W4200394663A5009696592 @default.
- W4200394663 hasAuthorship W4200394663A5013541996 @default.
- W4200394663 hasAuthorship W4200394663A5021870329 @default.
- W4200394663 hasAuthorship W4200394663A5027748782 @default.
- W4200394663 hasAuthorship W4200394663A5033707390 @default.
- W4200394663 hasAuthorship W4200394663A5060691200 @default.
- W4200394663 hasAuthorship W4200394663A5064109540 @default.
- W4200394663 hasAuthorship W4200394663A5073915516 @default.
- W4200394663 hasAuthorship W4200394663A5079710213 @default.
- W4200394663 hasAuthorship W4200394663A5083143279 @default.
- W4200394663 hasAuthorship W4200394663A5084844277 @default.
- W4200394663 hasConcept C119599485 @default.
- W4200394663 hasConcept C127413603 @default.
- W4200394663 hasConcept C138230450 @default.
- W4200394663 hasConcept C138885662 @default.
- W4200394663 hasConcept C159985019 @default.
- W4200394663 hasConcept C16115445 @default.
- W4200394663 hasConcept C165801399 @default.
- W4200394663 hasConcept C172385210 @default.
- W4200394663 hasConcept C192562407 @default.
- W4200394663 hasConcept C205200001 @default.
- W4200394663 hasConcept C21036866 @default.
- W4200394663 hasConcept C2361726 @default.
- W4200394663 hasConcept C24326235 @default.
- W4200394663 hasConcept C2778871202 @default.
- W4200394663 hasConcept C2779227376 @default.
- W4200394663 hasConcept C2779679103 @default.
- W4200394663 hasConcept C41895202 @default.
- W4200394663 hasConcept C49040817 @default.
- W4200394663 hasConcept C66283442 @default.
- W4200394663 hasConcept C78434282 @default.
- W4200394663 hasConceptScore W4200394663C119599485 @default.
- W4200394663 hasConceptScore W4200394663C127413603 @default.
- W4200394663 hasConceptScore W4200394663C138230450 @default.
- W4200394663 hasConceptScore W4200394663C138885662 @default.
- W4200394663 hasConceptScore W4200394663C159985019 @default.
- W4200394663 hasConceptScore W4200394663C16115445 @default.
- W4200394663 hasConceptScore W4200394663C165801399 @default.
- W4200394663 hasConceptScore W4200394663C172385210 @default.
- W4200394663 hasConceptScore W4200394663C192562407 @default.
- W4200394663 hasConceptScore W4200394663C205200001 @default.
- W4200394663 hasConceptScore W4200394663C21036866 @default.
- W4200394663 hasConceptScore W4200394663C2361726 @default.
- W4200394663 hasConceptScore W4200394663C24326235 @default.
- W4200394663 hasConceptScore W4200394663C2778871202 @default.
- W4200394663 hasConceptScore W4200394663C2779227376 @default.
- W4200394663 hasConceptScore W4200394663C2779679103 @default.
- W4200394663 hasConceptScore W4200394663C41895202 @default.
- W4200394663 hasConceptScore W4200394663C49040817 @default.
- W4200394663 hasConceptScore W4200394663C66283442 @default.
- W4200394663 hasConceptScore W4200394663C78434282 @default.
- W4200394663 hasFunder F4320311649 @default.
- W4200394663 hasLocation W42003946631 @default.
- W4200394663 hasOpenAccess W4200394663 @default.
- W4200394663 hasPrimaryLocation W42003946631 @default.
- W4200394663 hasRelatedWork W2034840008 @default.
- W4200394663 hasRelatedWork W2094894231 @default.
- W4200394663 hasRelatedWork W2149987955 @default.
- W4200394663 hasRelatedWork W2370713362 @default.
- W4200394663 hasRelatedWork W2373031308 @default.
- W4200394663 hasRelatedWork W2520145586 @default.
- W4200394663 hasRelatedWork W2541179089 @default.
- W4200394663 hasRelatedWork W2909967624 @default.
- W4200394663 hasRelatedWork W3039674310 @default.
- W4200394663 hasRelatedWork W2142519042 @default.
- W4200394663 isParatext "false" @default.
- W4200394663 isRetracted "false" @default.
- W4200394663 workType "article" @default.