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- W4214864095 abstract "Atomic force microscopy (AFM) has become an emerging powerful tool for imaging the surface morphology and charge conversion behaviors in energy research. This chapter would provide a series of primary AFM knowledge, structured by eight sections. First, it introduces the fundamental principles, which consider probe deflection behaviors and optical detection mechanisms in detail. The main-streaming AFM imaging modes, i.e. contact mode, tapping mode, and PeakForce tapping mode, have been demonstrated systematically. The best control of the tip-sample force plays a pivotal role in obtaining the ideal topography, especially for the soft, easy-deformed and viscous samples. Hence, we further highlight technical details of force control and quantitative nanoscale mechanical (QNM) measurement, as well as specify how to achieve high-resolution AFM imaging. Then, we give more demonstrations and examples about AFM application in air, liquid, and high-vacuum environments. Finally, local electrical conductivity measurement by conductive AFM mode is briefly presented, including the potential applications of electric current mapping in gas and liquid environments." @default.
- W4214864095 created "2022-03-05" @default.
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- W4214864095 date "2022-03-03" @default.
- W4214864095 modified "2023-10-16" @default.
- W4214864095 title "Principles and Basic Modes of Atomic Force Microscopy" @default.
- W4214864095 doi "https://doi.org/10.1201/9781003174042-1" @default.
- W4214864095 hasPublicationYear "2022" @default.
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