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• W4214884103 endingPage "166516" @default.
• W4214884103 startingPage "166516" @default.
• W4214884103 abstract "Track length growth as a function of etching time for three alpha particle energies and four different incident angles were investigated in thin CR-39 detectors. The samples were then etched in a 6.25 M NaOH solution at (70 ± 1) oC for different etching times. The experimental values of track depths and lengths were deduced from alpha track profiles in the CR-39 detector at different successive etching times. Experimental ranges were determined and compared to those stemming from the SRIM code. For the 3 energies studied, a shift of the amplitude of the maximum (peak) of measured track etch rates was observed. The possible origin of these variations is discussed." @default.
• W4214884103 created "2022-03-05" @default.
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• W4214884103 date "2022-05-01" @default.
• W4214884103 modified "2023-10-06" @default.
• W4214884103 title "On the question of track etch rate amplitude variation in the Bragg-peak vicinity: Experimental verification for low-energy <mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML display=inline id=d1e340 altimg=si4.svg><mml:mi>α</mml:mi></mml:math>-particle tracks in CR-39" @default.
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• W4214884103 doi "https://doi.org/10.1016/j.nima.2022.166516" @default.
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