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• W4214944389 endingPage "9" @default.
• W4214944389 startingPage "1" @default.
• W4214944389 abstract "Accurate thermal parameters of thin films are beneficial for the engineering thermal design and thermal management of electronic devices to improve the operating stability and prolong service life. In this article, a novel method for measuring the thermal diffusivity of thin films is proposed based on the thermal pulse method (TPM) for mapping space charge distribution, whose thermal response current is strongly determined by the temperature profiles within thin film. A multi-layer thin film structure is adopted, in which the tested film layer is thermally coupled on the dielectric film substrate with thermal parameters known. The thermal pulse by laser pulse excites the tested film and then penetrates into the dielectric film substrate. By analyzing the thermal response current of the dielectric film substrate, one can deduce the temperature profiles in both layers and therefore the thermal diffusivity of the tested film. The proposed method can determine the thermal diffusivity of both insulating and electric conduction films with the thickness tens of micrometers in through thickness direction. The obtained values of the thermal diffusivity of polyimide (PI), bi-oriented polypropylene (BOPP), polyethylene 2,6-naphthalate (PEN), tin(Sn) foil, and lead (Pb) foil are well consistent with the data provided in the literatures. By the analyzing heat boundary conditions, the interface thermal resistance between the tested film and the dielectric film substrate can be also determined at the same time." @default.
• W4214944389 created "2022-03-05" @default.
• W4214944389 creator A5052354691 @default.
• W4214944389 creator A5076452606 @default.
• W4214944389 creator A5084139422 @default.
• W4214944389 creator A5088519469 @default.
• W4214944389 date "2022-01-01" @default.
• W4214944389 modified "2023-09-27" @default.
• W4214944389 title "Measurement of Thermal Diffusivity of Thin Film in Thickness Direction Using an Ordinary Dielectric Film as the Sensor" @default.
• W4214944389 cites W1579435939 @default.
• W4214944389 cites W1982934549 @default.
• W4214944389 cites W2018019606 @default.
• W4214944389 cites W2027548720 @default.
• W4214944389 cites W2029541326 @default.
• W4214944389 cites W2032789410 @default.
• W4214944389 cites W2050958739 @default.
• W4214944389 cites W2059836893 @default.
• W4214944389 cites W2061060560 @default.
• W4214944389 cites W2069667799 @default.
• W4214944389 cites W2091364344 @default.
• W4214944389 cites W2110498146 @default.
• W4214944389 cites W2130254050 @default.
• W4214944389 cites W2137436022 @default.
• W4214944389 cites W2155048104 @default.
• W4214944389 cites W2158139941 @default.
• W4214944389 cites W2163546991 @default.
• W4214944389 cites W2468411592 @default.
• W4214944389 cites W2554356505 @default.
• W4214944389 cites W2583835717 @default.
• W4214944389 cites W2793800666 @default.
• W4214944389 cites W2854622314 @default.
• W4214944389 cites W2921711259 @default.
• W4214944389 cites W3111972259 @default.
• W4214944389 cites W3154876879 @default.
• W4214944389 cites W4255230100 @default.
• W4214944389 doi "https://doi.org/10.1109/tim.2022.3155760" @default.
• W4214944389 hasPublicationYear "2022" @default.
• W4214944389 type Work @default.
• W4214944389 citedByCount "1" @default.
• W4214944389 countsByYear W42149443892022 @default.
• W4214944389 crossrefType "journal-article" @default.
• W4214944389 hasAuthorship W4214944389A5052354691 @default.
• W4214944389 hasAuthorship W4214944389A5076452606 @default.
• W4214944389 hasAuthorship W4214944389A5084139422 @default.
• W4214944389 hasAuthorship W4214944389A5088519469 @default.
• W4214944389 hasConcept C102232406 @default.
• W4214944389 hasConcept C111368507 @default.
• W4214944389 hasConcept C121332964 @default.
• W4214944389 hasConcept C127313418 @default.
• W4214944389 hasConcept C133386390 @default.
• W4214944389 hasConcept C159985019 @default.
• W4214944389 hasConcept C166841482 @default.
• W4214944389 hasConcept C171250308 @default.
• W4214944389 hasConcept C172100665 @default.
• W4214944389 hasConcept C19067145 @default.
• W4214944389 hasConcept C192562407 @default.
• W4214944389 hasConcept C2777289219 @default.
• W4214944389 hasConcept C2777503765 @default.
• W4214944389 hasConcept C2779227376 @default.
• W4214944389 hasConcept C37668627 @default.
• W4214944389 hasConcept C49040817 @default.
• W4214944389 hasConcept C7363328 @default.
• W4214944389 hasConcept C97355855 @default.
• W4214944389 hasConceptScore W4214944389C102232406 @default.
• W4214944389 hasConceptScore W4214944389C111368507 @default.
• W4214944389 hasConceptScore W4214944389C121332964 @default.
• W4214944389 hasConceptScore W4214944389C127313418 @default.
• W4214944389 hasConceptScore W4214944389C133386390 @default.
• W4214944389 hasConceptScore W4214944389C159985019 @default.
• W4214944389 hasConceptScore W4214944389C166841482 @default.
• W4214944389 hasConceptScore W4214944389C171250308 @default.
• W4214944389 hasConceptScore W4214944389C172100665 @default.
• W4214944389 hasConceptScore W4214944389C19067145 @default.
• W4214944389 hasConceptScore W4214944389C192562407 @default.
• W4214944389 hasConceptScore W4214944389C2777289219 @default.
• W4214944389 hasConceptScore W4214944389C2777503765 @default.
• W4214944389 hasConceptScore W4214944389C2779227376 @default.
• W4214944389 hasConceptScore W4214944389C37668627 @default.
• W4214944389 hasConceptScore W4214944389C49040817 @default.
• W4214944389 hasConceptScore W4214944389C7363328 @default.
• W4214944389 hasConceptScore W4214944389C97355855 @default.
• W4214944389 hasFunder F4320309612 @default.
• W4214944389 hasFunder F4320321001 @default.
• W4214944389 hasLocation W42149443891 @default.
• W4214944389 hasOpenAccess W4214944389 @default.
• W4214944389 hasPrimaryLocation W42149443891 @default.
• W4214944389 hasRelatedWork W2078190644 @default.
• W4214944389 hasRelatedWork W2079021643 @default.
• W4214944389 hasRelatedWork W2083559478 @default.
• W4214944389 hasRelatedWork W2322197505 @default.
• W4214944389 hasRelatedWork W2375436961 @default.
• W4214944389 hasRelatedWork W2604564397 @default.
• W4214944389 hasRelatedWork W2605717555 @default.
• W4214944389 hasRelatedWork W64882676 @default.
• W4214944389 hasRelatedWork W192021738 @default.
• W4214944389 hasRelatedWork W2188504030 @default.
• W4214944389 hasVolume "71" @default.
• W4214944389 isParatext "false" @default.

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