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• W4225007774 abstract "Starting with the full characterization of the n- and p-MOSFETs in a 22-nm FDSOI CMOS process from DC and S-parameter measurements over temperature in the 2 K to 400 K range, we develop circuit design guidelines and design methodologies for digital, analog mixed-signal and mm-wave circuit building blocks that take advantage of the unique features of FDSOI transistors enabled by the presence of the back gate and buried oxide. A constant-current–density-to-backgate-voltage-conversion bias circuit, operating across the entire temperature range is demonstrated to optimally bias CMOS inverters in a variety of digital, analog-mixed-signal and mm-wave circuits for different use scenarios that optimize noise, gain, linearity, and/or bandwidth. Measurement data and constant current density design methodologies are used to illustrate the design of transimpedance amplifiers for qubit readout and fibreoptic receivers, broadband switches, mm-wave time-interleaved ADC samplers, large-swing DACs, and power amplifiers." @default.
• W4225007774 created "2022-04-29" @default.
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• W4225007774 date "2022-08-01" @default.
• W4225007774 modified "2023-10-06" @default.
• W4225007774 title "Harnessing the unique features of FDSOI CMOS technology in fibreoptic, millimetre-wave, and quantum computing circuits from 2 K to 400 K" @default.
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• W4225007774 doi "https://doi.org/10.1016/j.sse.2022.108343" @default.
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