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Matches in SemOpenAlex for { <https://semopenalex.org/work/W4225331993> ?p ?o ?g. }

• W4225331993 abstract "We present a detailed analysis of Off-state Time Dependent Dielectric Breakdown (TDDB) under non-uniform field performed in MOSFET devices from 28nm FDSOI, 65nm SOI to 130nm nodes. Oxide breakdown in thin gate oxide is characterized under DC stress with different gate-length LG and as function of drain voltage VDS and temperature. We show that the leakage current is a better monitor for TDDB dependence under Off-mode stress whereas a new modeling is proposed. It is found that Weibull slopes β are higher in PFET due to large amount of injected hot electrons than in NFET when hot holes are involved." @default.
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• W4225331993 date "2022-03-01" @default.
• W4225331993 modified "2023-09-29" @default.
• W4225331993 title "New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes" @default.
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• W4225331993 doi "https://doi.org/10.1109/irps48227.2022.9764431" @default.
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