FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4225366157> ?p ?o ?g. }

• W4225366157 endingPage "3333" @default.
• W4225366157 startingPage "3328" @default.
• W4225366157 abstract "As the silicon carbide (SiC) power metal–oxide–semiconductor field-effect transistor (MOSFET) develops, increasing efforts are placed on ac bias temperature instability (AC BTI). It was reported that AC BTI becomes significant when and only when the gate stress is bipolar. A detailed study is made in this article to reveal the underpinning mechanism. A physical model is proposed to explain on how and why the gate stress bipolar affects the threshold drift. It is found that the gate stress polarity has to be carefully defined. As the model shows, it is the bipolar electric field, rather than the gate voltage itself, that speeds up the threshold voltage drift. It is hoped that this study provides a stepping stone toward the eventual understanding and management of AC BTI." @default.
• W4225366157 created "2022-05-05" @default.
• W4225366157 creator A5004872920 @default.
• W4225366157 creator A5052008806 @default.
• W4225366157 creator A5065880092 @default.
• W4225366157 creator A5068176076 @default.
• W4225366157 creator A5068537109 @default.
• W4225366157 creator A5081295548 @default.
• W4225366157 date "2022-06-01" @default.
• W4225366157 modified "2023-09-28" @default.
• W4225366157 title "Gate Stress Polarity Dependence of AC Bias Temperature Instability in Silicon Carbide MOSFETs" @default.
• W4225366157 cites W2066211048 @default.
• W4225366157 cites W2526187564 @default.
• W4225366157 cites W2770666768 @default.
• W4225366157 cites W2771705811 @default.
• W4225366157 cites W2799570083 @default.
• W4225366157 cites W2803528042 @default.
• W4225366157 cites W2944968774 @default.
• W4225366157 cites W2945872178 @default.
• W4225366157 cites W2978403380 @default.
• W4225366157 cites W3005732983 @default.
• W4225366157 cites W3038946111 @default.
• W4225366157 cites W3041791926 @default.
• W4225366157 cites W3110201978 @default.
• W4225366157 cites W4299689474 @default.
• W4225366157 doi "https://doi.org/10.1109/ted.2022.3164641" @default.
• W4225366157 hasPublicationYear "2022" @default.
• W4225366157 type Work @default.
• W4225366157 citedByCount "3" @default.
• W4225366157 countsByYear W42253661572022 @default.
• W4225366157 countsByYear W42253661572023 @default.
• W4225366157 crossrefType "journal-article" @default.
• W4225366157 hasAuthorship W4225366157A5004872920 @default.
• W4225366157 hasAuthorship W4225366157A5052008806 @default.
• W4225366157 hasAuthorship W4225366157A5065880092 @default.
• W4225366157 hasAuthorship W4225366157A5068176076 @default.
• W4225366157 hasAuthorship W4225366157A5068537109 @default.
• W4225366157 hasAuthorship W4225366157A5081295548 @default.
• W4225366157 hasBestOaLocation W42253661572 @default.
• W4225366157 hasConcept C119599485 @default.
• W4225366157 hasConcept C121332964 @default.
• W4225366157 hasConcept C127413603 @default.
• W4225366157 hasConcept C138885662 @default.
• W4225366157 hasConcept C1491633281 @default.
• W4225366157 hasConcept C159985019 @default.
• W4225366157 hasConcept C165801399 @default.
• W4225366157 hasConcept C172385210 @default.
• W4225366157 hasConcept C185592680 @default.
• W4225366157 hasConcept C192562407 @default.
• W4225366157 hasConcept C21036866 @default.
• W4225366157 hasConcept C23061349 @default.
• W4225366157 hasConcept C2361726 @default.
• W4225366157 hasConcept C26873012 @default.
• W4225366157 hasConcept C2777361361 @default.
• W4225366157 hasConcept C2778413303 @default.
• W4225366157 hasConcept C2780722187 @default.
• W4225366157 hasConcept C41895202 @default.
• W4225366157 hasConcept C49040817 @default.
• W4225366157 hasConcept C55493867 @default.
• W4225366157 hasConcept C557185 @default.
• W4225366157 hasConceptScore W4225366157C119599485 @default.
• W4225366157 hasConceptScore W4225366157C121332964 @default.
• W4225366157 hasConceptScore W4225366157C127413603 @default.
• W4225366157 hasConceptScore W4225366157C138885662 @default.
• W4225366157 hasConceptScore W4225366157C1491633281 @default.
• W4225366157 hasConceptScore W4225366157C159985019 @default.
• W4225366157 hasConceptScore W4225366157C165801399 @default.
• W4225366157 hasConceptScore W4225366157C172385210 @default.
• W4225366157 hasConceptScore W4225366157C185592680 @default.
• W4225366157 hasConceptScore W4225366157C192562407 @default.
• W4225366157 hasConceptScore W4225366157C21036866 @default.
• W4225366157 hasConceptScore W4225366157C23061349 @default.
• W4225366157 hasConceptScore W4225366157C2361726 @default.
• W4225366157 hasConceptScore W4225366157C26873012 @default.
• W4225366157 hasConceptScore W4225366157C2777361361 @default.
• W4225366157 hasConceptScore W4225366157C2778413303 @default.
• W4225366157 hasConceptScore W4225366157C2780722187 @default.
• W4225366157 hasConceptScore W4225366157C41895202 @default.
• W4225366157 hasConceptScore W4225366157C49040817 @default.
• W4225366157 hasConceptScore W4225366157C55493867 @default.
• W4225366157 hasConceptScore W4225366157C557185 @default.
• W4225366157 hasIssue "6" @default.
• W4225366157 hasLocation W42253661571 @default.
• W4225366157 hasLocation W42253661572 @default.
• W4225366157 hasOpenAccess W4225366157 @default.
• W4225366157 hasPrimaryLocation W42253661571 @default.
• W4225366157 hasRelatedWork W1517134236 @default.
• W4225366157 hasRelatedWork W1989202103 @default.
• W4225366157 hasRelatedWork W2064263658 @default.
• W4225366157 hasRelatedWork W2129890820 @default.
• W4225366157 hasRelatedWork W2144706983 @default.
• W4225366157 hasRelatedWork W2595838235 @default.
• W4225366157 hasRelatedWork W2744826161 @default.
• W4225366157 hasRelatedWork W2787881439 @default.
• W4225366157 hasRelatedWork W2980246134 @default.
• W4225366157 hasRelatedWork W4225366157 @default.
• W4225366157 hasVolume "69" @default.
• W4225366157 isParatext "false" @default.

• next