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- W4238781906 endingPage "100" @default.
- W4238781906 startingPage "49" @default.
- W4238781906 abstract "The line shape caused by lattice distortions in a crystal is reviewed. It is revealed that the broadening of a diffraction peak with indices hkl is related to the mean-square-strain perpendicular to the reflecting (hkl) lattice planes. The strain broadening of line profiles depends on the order of diffraction. The line profiles for a crystal in which the lattice distortions are caused by dislocations are described in detail in this chapter. It is revealed that the anisotropic strain field of dislocations yields a special dependence of peak broadening on indices of reflection. The stronger the screening of the strain fields of dislocations, the longer the tails in the diffraction profiles. For polarized dislocation walls, the diffraction peak is asymmetric, and the antisymmetric component of the profile is determined by the dislocation polarization. It is shown that the strains in nanoparticles resulted by the relaxation of their surfaces also lead to line broadening." @default.
- W4238781906 created "2022-05-12" @default.
- W4238781906 date "2014-01-20" @default.
- W4238781906 modified "2023-09-27" @default.
- W4238781906 title "Strain Broadening of X-Ray Diffraction Peaks" @default.
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- W4238781906 doi "https://doi.org/10.4018/978-1-4666-5852-3.ch003" @default.
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