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- W4239149807 abstract "An integrated circuit tester based on interferometric imaging. This technique holds promise of ultrafast noninvasive testing of the voltage states of sections of microchips. Continued success of the Laboratory`s High School Summer Research Program. The program, which started in 1989, has brought several dozen young people into intimate contact with modern science and technology. The volume concludes with a Laser Facility Report and the National Laser Users` Facility News." @default.
- W4239149807 created "2022-05-12" @default.
- W4239149807 date "1998-02-01" @default.
- W4239149807 modified "2023-10-16" @default.
- W4239149807 title "LLE review. Quarterly report, July 1997--September 1997" @default.
- W4239149807 doi "https://doi.org/10.2172/567500" @default.
- W4239149807 hasPublicationYear "1998" @default.
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