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• W4240059611 abstract "Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don’t care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size." @default.
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• W4240059611 date "2008-11-01" @default.
• W4240059611 modified "2023-09-24" @default.
• W4240059611 title "Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification" @default.
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• W4240059611 doi "https://doi.org/10.1109/iccad.2008.4681551" @default.
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