Matches in SemOpenAlex for { <https://semopenalex.org/work/W4241941616> ?p ?o ?g. }
- W4241941616 endingPage "1532" @default.
- W4241941616 startingPage "1528" @default.
- W4241941616 abstract "The reliability of very thin gate oxide under electrostatic discharge-like pulse stress is investigated. Time-dependent dielectric breakdown of gate oxide with thicknesses ranging from 2.2 to 4.7 nm is characterized down to the nanosecond time regime. The 1/E model best fits the time-to-breakdown data. Self-heating does not need to be incorporated into the time-to-breakdown model. The oxide trap generation rate is a function of the stress pulse-width for nanosecond and microsecond stress pulses." @default.
- W4241941616 created "2022-05-12" @default.
- W4241941616 creator A5019748322 @default.
- W4241941616 creator A5039815679 @default.
- W4241941616 date "2004-09-01" @default.
- W4241941616 modified "2023-10-17" @default.
- W4241941616 title "Gate Oxide Reliability Under ESD-Like Pulse Stress" @default.
- W4241941616 cites W1580368590 @default.
- W4241941616 cites W1589467559 @default.
- W4241941616 cites W1972357248 @default.
- W4241941616 cites W2016170448 @default.
- W4241941616 cites W2019297315 @default.
- W4241941616 cites W2021750186 @default.
- W4241941616 cites W2044464076 @default.
- W4241941616 cites W2059795568 @default.
- W4241941616 cites W2073090060 @default.
- W4241941616 cites W2081048183 @default.
- W4241941616 cites W2086730352 @default.
- W4241941616 cites W2087661196 @default.
- W4241941616 cites W2093446542 @default.
- W4241941616 cites W2097129252 @default.
- W4241941616 cites W2113488650 @default.
- W4241941616 cites W2115043420 @default.
- W4241941616 cites W2117810651 @default.
- W4241941616 cites W2128121770 @default.
- W4241941616 cites W2130770701 @default.
- W4241941616 cites W2130864081 @default.
- W4241941616 cites W2143852074 @default.
- W4241941616 cites W2147877201 @default.
- W4241941616 cites W2147888186 @default.
- W4241941616 cites W2539561614 @default.
- W4241941616 cites W2566006804 @default.
- W4241941616 cites W3024268879 @default.
- W4241941616 cites W3025735866 @default.
- W4241941616 doi "https://doi.org/10.1109/ted.2004.834683" @default.
- W4241941616 hasPublicationYear "2004" @default.
- W4241941616 type Work @default.
- W4241941616 citedByCount "14" @default.
- W4241941616 countsByYear W42419416162021 @default.
- W4241941616 countsByYear W42419416162022 @default.
- W4241941616 crossrefType "journal-article" @default.
- W4241941616 hasAuthorship W4241941616A5019748322 @default.
- W4241941616 hasAuthorship W4241941616A5039815679 @default.
- W4241941616 hasConcept C119599485 @default.
- W4241941616 hasConcept C120665830 @default.
- W4241941616 hasConcept C121332964 @default.
- W4241941616 hasConcept C127413603 @default.
- W4241941616 hasConcept C133386390 @default.
- W4241941616 hasConcept C138885662 @default.
- W4241941616 hasConcept C152909973 @default.
- W4241941616 hasConcept C163258240 @default.
- W4241941616 hasConcept C165801399 @default.
- W4241941616 hasConcept C172385210 @default.
- W4241941616 hasConcept C191897082 @default.
- W4241941616 hasConcept C192562407 @default.
- W4241941616 hasConcept C21036866 @default.
- W4241941616 hasConcept C2361726 @default.
- W4241941616 hasConcept C2779851234 @default.
- W4241941616 hasConcept C2780167933 @default.
- W4241941616 hasConcept C34742353 @default.
- W4241941616 hasConcept C41895202 @default.
- W4241941616 hasConcept C43214815 @default.
- W4241941616 hasConcept C49040817 @default.
- W4241941616 hasConcept C51141536 @default.
- W4241941616 hasConcept C520434653 @default.
- W4241941616 hasConcept C62520636 @default.
- W4241941616 hasConcept C70401718 @default.
- W4241941616 hasConceptScore W4241941616C119599485 @default.
- W4241941616 hasConceptScore W4241941616C120665830 @default.
- W4241941616 hasConceptScore W4241941616C121332964 @default.
- W4241941616 hasConceptScore W4241941616C127413603 @default.
- W4241941616 hasConceptScore W4241941616C133386390 @default.
- W4241941616 hasConceptScore W4241941616C138885662 @default.
- W4241941616 hasConceptScore W4241941616C152909973 @default.
- W4241941616 hasConceptScore W4241941616C163258240 @default.
- W4241941616 hasConceptScore W4241941616C165801399 @default.
- W4241941616 hasConceptScore W4241941616C172385210 @default.
- W4241941616 hasConceptScore W4241941616C191897082 @default.
- W4241941616 hasConceptScore W4241941616C192562407 @default.
- W4241941616 hasConceptScore W4241941616C21036866 @default.
- W4241941616 hasConceptScore W4241941616C2361726 @default.
- W4241941616 hasConceptScore W4241941616C2779851234 @default.
- W4241941616 hasConceptScore W4241941616C2780167933 @default.
- W4241941616 hasConceptScore W4241941616C34742353 @default.
- W4241941616 hasConceptScore W4241941616C41895202 @default.
- W4241941616 hasConceptScore W4241941616C43214815 @default.
- W4241941616 hasConceptScore W4241941616C49040817 @default.
- W4241941616 hasConceptScore W4241941616C51141536 @default.
- W4241941616 hasConceptScore W4241941616C520434653 @default.
- W4241941616 hasConceptScore W4241941616C62520636 @default.
- W4241941616 hasConceptScore W4241941616C70401718 @default.
- W4241941616 hasIssue "9" @default.
- W4241941616 hasLocation W42419416161 @default.
- W4241941616 hasOpenAccess W4241941616 @default.
- W4241941616 hasPrimaryLocation W42419416161 @default.
- W4241941616 hasRelatedWork W1199668799 @default.
- W4241941616 hasRelatedWork W2099624314 @default.
- W4241941616 hasRelatedWork W2210936481 @default.