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• W4242815488 abstract "This chapter contains sections titled: Introduction Structural aspects Imaging techniques Optical SFs signature More realistic type-II QW model Transfer matrix method Focussing on a single QW Conclusions References" @default.
• W4242815488 created "2022-05-12" @default.
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• W4242815488 date "2009-10-21" @default.
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• W4242815488 title "Optical Properties of As-Grown and Process-Induced Stacking Faults in 4H-SiC" @default.
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• W4242815488 doi "https://doi.org/10.1002/9783527629053.ch8" @default.
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