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- W4243485298 abstract "Due to the continuously reduced feature size, supply voltage, and increased on-chip density, modern microprocessors are projected to be more susceptible to soft error strikes." @default.
- W4243485298 created "2022-05-12" @default.
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- W4243485298 date "2013-09-19" @default.
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- W4243485298 title "Exploring the Vulnerability of CMPs to Soft Errors with 3D Stacked Non-Volatile Memory" @default.
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- W4243485298 doi "https://doi.org/10.1007/978-3-319-00681-9_4" @default.
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