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- W4244550263 abstract "This chapter discusses device characterization methods, that is, methods to determine the response of a solar cell to optical and electrical excitation. The challenge of device characterization lies not only in the measurement of the samples but mostly in the interpretation of data, which often goes hand in hand with device simulation as described in the book. The measurement of the illuminated current/voltage (J/V) curves under standard measuring conditions is of crucial importance for determination and comparison of the efficiency of the optoelectrical energy conversion process. The chapter starts discussion on J/V curves with the ideal solar cell in the Shockley-Queisser limit. A J/V measurement yields information on the absolute value of the short-circuit current density (Jsc) produced in a solar cell. The chapter focuses on thin-film silicon solar cells and discusses the main challenges in interpretation of quantum efficiency measurements. The interpretation of quantum efficiency measurements differs considerably depending on the solar cell type." @default.
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- W4244550263 date "2016-07-22" @default.
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- W4244550263 title "Fundamental Electrical Characterization of Thin‐Film Solar Cells" @default.
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- W4244550263 doi "https://doi.org/10.1002/9783527699025.ch2" @default.
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