FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4245661807> ?p ?o ?g. }

• W4245661807 abstract "In this paper, an industry-level new-generation EDA solution for reliability-aware design in nanoscale FinFET technology is presented for the first time, with new compact transistor aging models and upgraded circuit reliability simulator. Our work solves various issues found in FinFET silicon data of NBTI aging. Especially, instead of ignoring or less accurate NBTI recovery effect model in traditional simulators, accurate NBTI degradation and recovery models are proposed and validated by silicon data for full stress/recovery range in the FinFET technology. The history effect, one of the important features of NBTI which is missing in the existing industrial tools, is included based on new simulation methodology. Since FinFET reliability data suggests the conventional linear extrapolation method is no longer valid, an accurate fast-speed long-term prediction method is proposed based on smart iteration flows of equivalence. The frequency dependence of NBTI, which draws much attention, is included in the new simulator automatically. This work has been integrated into Cadence reliability simulator, providing designers an opportunity for accurate reliability-aware circuit design." @default.
• W4245661807 created "2022-05-12" @default.
• W4245661807 creator A5002760019 @default.
• W4245661807 creator A5005663330 @default.
• W4245661807 creator A5012603707 @default.
• W4245661807 creator A5020415885 @default.
• W4245661807 creator A5027931425 @default.
• W4245661807 creator A5031994898 @default.
• W4245661807 creator A5043582183 @default.
• W4245661807 creator A5047052112 @default.
• W4245661807 creator A5055131988 @default.
• W4245661807 creator A5061018931 @default.
• W4245661807 creator A5064462401 @default.
• W4245661807 creator A5068754723 @default.
• W4245661807 date "2017-11-01" @default.
• W4245661807 modified "2023-10-16" @default.
• W4245661807 title "Towards reliability-aware circuit design in nanoscale FinFET technology: — New-generation aging model and circuit reliability simulator" @default.
• W4245661807 cites W1522481364 @default.
• W4245661807 cites W1568009616 @default.
• W4245661807 cites W1928777464 @default.
• W4245661807 cites W1977366479 @default.
• W4245661807 cites W1982515552 @default.
• W4245661807 cites W2045583681 @default.
• W4245661807 cites W2047325217 @default.
• W4245661807 cites W2067127687 @default.
• W4245661807 cites W2073484775 @default.
• W4245661807 cites W2075614785 @default.
• W4245661807 cites W2075695290 @default.
• W4245661807 cites W2111642414 @default.
• W4245661807 cites W2134777311 @default.
• W4245661807 cites W2139471975 @default.
• W4245661807 cites W2149848632 @default.
• W4245661807 cites W2159087234 @default.
• W4245661807 cites W2162734816 @default.
• W4245661807 cites W2167724032 @default.
• W4245661807 cites W2170333286 @default.
• W4245661807 cites W2365858435 @default.
• W4245661807 doi "https://doi.org/10.1109/iccad.2017.8203856" @default.
• W4245661807 hasPublicationYear "2017" @default.
• W4245661807 type Work @default.
• W4245661807 citedByCount "19" @default.
• W4245661807 countsByYear W42456618072017 @default.
• W4245661807 countsByYear W42456618072020 @default.
• W4245661807 countsByYear W42456618072021 @default.
• W4245661807 countsByYear W42456618072022 @default.
• W4245661807 countsByYear W42456618072023 @default.
• W4245661807 crossrefType "proceedings-article" @default.
• W4245661807 hasAuthorship W4245661807A5002760019 @default.
• W4245661807 hasAuthorship W4245661807A5005663330 @default.
• W4245661807 hasAuthorship W4245661807A5012603707 @default.
• W4245661807 hasAuthorship W4245661807A5020415885 @default.
• W4245661807 hasAuthorship W4245661807A5027931425 @default.
• W4245661807 hasAuthorship W4245661807A5031994898 @default.
• W4245661807 hasAuthorship W4245661807A5043582183 @default.
• W4245661807 hasAuthorship W4245661807A5047052112 @default.
• W4245661807 hasAuthorship W4245661807A5055131988 @default.
• W4245661807 hasAuthorship W4245661807A5061018931 @default.
• W4245661807 hasAuthorship W4245661807A5064462401 @default.
• W4245661807 hasAuthorship W4245661807A5068754723 @default.
• W4245661807 hasConcept C119599485 @default.
• W4245661807 hasConcept C121332964 @default.
• W4245661807 hasConcept C127413603 @default.
• W4245661807 hasConcept C132459708 @default.
• W4245661807 hasConcept C134306372 @default.
• W4245661807 hasConcept C149635348 @default.
• W4245661807 hasConcept C163258240 @default.
• W4245661807 hasConcept C165801399 @default.
• W4245661807 hasConcept C172385210 @default.
• W4245661807 hasConcept C190560348 @default.
• W4245661807 hasConcept C200601418 @default.
• W4245661807 hasConcept C24326235 @default.
• W4245661807 hasConcept C2778309119 @default.
• W4245661807 hasConcept C2778413303 @default.
• W4245661807 hasConcept C33923547 @default.
• W4245661807 hasConcept C41008148 @default.
• W4245661807 hasConcept C43214815 @default.
• W4245661807 hasConcept C557185 @default.
• W4245661807 hasConcept C62520636 @default.
• W4245661807 hasConceptScore W4245661807C119599485 @default.
• W4245661807 hasConceptScore W4245661807C121332964 @default.
• W4245661807 hasConceptScore W4245661807C127413603 @default.
• W4245661807 hasConceptScore W4245661807C132459708 @default.
• W4245661807 hasConceptScore W4245661807C134306372 @default.
• W4245661807 hasConceptScore W4245661807C149635348 @default.
• W4245661807 hasConceptScore W4245661807C163258240 @default.
• W4245661807 hasConceptScore W4245661807C165801399 @default.
• W4245661807 hasConceptScore W4245661807C172385210 @default.
• W4245661807 hasConceptScore W4245661807C190560348 @default.
• W4245661807 hasConceptScore W4245661807C200601418 @default.
• W4245661807 hasConceptScore W4245661807C24326235 @default.
• W4245661807 hasConceptScore W4245661807C2778309119 @default.
• W4245661807 hasConceptScore W4245661807C2778413303 @default.
• W4245661807 hasConceptScore W4245661807C33923547 @default.
• W4245661807 hasConceptScore W4245661807C41008148 @default.
• W4245661807 hasConceptScore W4245661807C43214815 @default.
• W4245661807 hasConceptScore W4245661807C557185 @default.
• W4245661807 hasConceptScore W4245661807C62520636 @default.
• W4245661807 hasLocation W42456618071 @default.
• W4245661807 hasOpenAccess W4245661807 @default.
• W4245661807 hasPrimaryLocation W42456618071 @default.

• next