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- W4246032579 abstract "The traditional way to inspect optical systems is the use of a specially designed and well known test object for image analysis of the system under test. Image analysis methods have also been used to inspect optical surfaces. This chapter describes basis techniques and setups, analysis methods and algorithms, calibration techniques and accuracy and error sources which are related to the image analysis techniques such as star test, slit test, distortion metrology, deflectometers, and pattern and fringe projectors. A variety of test targets are available which are used to check the resolution and contrast transfer of optical systems. In most cases the targets are used for visual inspections. Test targets can be used to qualify systems in a quantitative way by letting a computer evaluate and quantify the captured test images. The general approach to identifying distortion in an image is to apply cross-correlation methods using suitable masks." @default.
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- W4246032579 date "2012-04-03" @default.
- W4246032579 modified "2023-10-17" @default.
- W4246032579 title "Image Analysis" @default.
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- W4246032579 doi "https://doi.org/10.1002/9783527699230.ch4" @default.
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