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- W4253656543 abstract "An analysis of image formation and the origins of topographical effects in emission microscopy are presented. Simplified models of positive and negative surface relief are used in a quantitative treatment of several topographical effects. Negative surface relief is modeled by a trough having a hyperbolic field. The model for positive relief is a rounded ridge simulated by an equipotential surface of the electric field surrounding a half cylinder on a plane. The electron trajectories for the trough model are calculated in the principal azimuths, and analytical expressions are obtained for the time of flight and apparent distance from the anode of the virtual specimen surface formed in the acceleration process. Corresponding expressions for the ridge are derived for trajectories in the principal azimuth containing the cylinder axis. These expressions show that there is a very large depth magnification caused by relief. The effect is larger for negative than for positive topography of comparable geometries. The depth magnification for a trough or ridge is different for trajectories in different azimuths. The resulting astigmatic effect is greater for the trough than for the ridge. Topographical contrast is examined by calculating the trajectories of electrons emitted from the sloping walls of the trough. Tilting of the cone of electrons results in pronounced contrast, particularly when a limiting aperture stop is present. This treatment of topographical effects in emission microscopy differs from previous work in that the effects on the image are calculated analytically for simplified models of negative and positive topography. These results are generalized for the interpretation of photoelectron images of specimens with topography." @default.
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- W4253656543 date "1980-01-01" @default.
- W4253656543 modified "2023-09-23" @default.
- W4253656543 title "Topographical effects in emission microscopy" @default.
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- W4253656543 doi "https://doi.org/10.1016/0304-3991(80)90044-3" @default.
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