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- W4254718542 abstract "The first goal of this book is to present the basics of Failure Analysis (FA), which is considered the key action for solving reliability issues. The second goal promotes the idea of reliability, to show the importance of this discipline and the necessity of supporting its goals in achieving a given level of reliability as a key characteristic of any product. The book aims to show the industry managers the reasons for taking reliability issues into account from the design phase onwards, through the whole cycle of development of a product. The third goal of the book starts from our subjective approach to reliability. The book serves as a reference work for those involved in the design, fabrication and testing of electronic components, but also for those who are using these components in complex systems and want to discover the roots of the reliability flaws for their products. Controlled Vocabulary Terms electron device testing; failure analysis; microfabrication; product life cycle management" @default.
- W4254718542 created "2022-05-12" @default.
- W4254718542 date "2011-04-26" @default.
- W4254718542 modified "2023-09-26" @default.
- W4254718542 title "Introduction" @default.
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- W4254718542 doi "https://doi.org/10.1002/9781119990093.ch1" @default.
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