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- W4255016455 abstract "The trend to continuously advance the semiconductor technologies to match the Moore's law raises several issues, including how to effectively test integrated circuits (both at the end of the manufacturing process and in the field). The goal of this chapter is to summarize the current status of test technologies, highlighting the major challenges, and some solutions. The chapter gives special emphasis to test of devices manufactured with new semiconductor technologies alternative to the CMOS ones." @default.
- W4255016455 created "2022-05-12" @default.
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- W4255016455 date "2017-04-07" @default.
- W4255016455 modified "2023-10-14" @default.
- W4255016455 title "Nanotechnologies Testing" @default.
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- W4255016455 doi "https://doi.org/10.1002/9783527800728.ch17" @default.
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