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- W4256146588 abstract "IEEJ Transactions on Electrical and Electronic EngineeringVolume 2, Issue 3 p. ix-x Extended Summary In situ visualization of degradation of silicon field emitter tips Naoyuki Nozawa, Naoyuki Nozawa Non-member The University of TokyoSearch for more papers by this authorKuniyuki Kakushima, Kuniyuki Kakushima Member Tokyo Institute of TechnologySearch for more papers by this authorGen Hashiguchi, Gen Hashiguchi Member Kagawa UniversitySearch for more papers by this authorHiroyuki Fujita, Hiroyuki Fujita Member fujita@iis.u-tokyo.ac.jp The University of TokyoSearch for more papers by this author Naoyuki Nozawa, Naoyuki Nozawa Non-member The University of TokyoSearch for more papers by this authorKuniyuki Kakushima, Kuniyuki Kakushima Member Tokyo Institute of TechnologySearch for more papers by this authorGen Hashiguchi, Gen Hashiguchi Member Kagawa UniversitySearch for more papers by this authorHiroyuki Fujita, Hiroyuki Fujita Member fujita@iis.u-tokyo.ac.jp The University of TokyoSearch for more papers by this author First published: 26 April 2007 https://doi.org/10.1002/tee.20166AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume2, Issue3May 2007Pages ix-x RelatedInformation" @default.
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- W4256146588 title "In situ visualization of degradation of silicon field emitter tips" @default.
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