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- W4280490634 abstract "This chapter provides a brief introduction to Transmission Electron Microscopy (TEM) and related techniques as a tool for researches of superconducting materials, and provides a few examples how to use these techniques for micro-, nano- and atomic structural characterizations. Electron microscopy provides a unique capability to obtain, by direct observation, information which can only be obtained in a statistical form by x-ray and neutron crystallography. In the electron diffraction mode, the spots appear in addition to the direct beam spot at the center, making a particular pattern based on a crystal structure and its crystallographic orientation. Electron diffraction is also very sensitive to local deviation from the perfect structure. Superconducting magnets require high in long-length wire forms, which are inevitably polycrystalline. However, TEM images do reveal some porosity and secondary phase that obstruct some current flow, indicating room for further process optimization." @default.
- W4280490634 created "2022-05-22" @default.
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- W4280490634 date "2022-05-17" @default.
- W4280490634 modified "2023-09-29" @default.
- W4280490634 title "Transmission Electron Microscopy" @default.
- W4280490634 doi "https://doi.org/10.1201/9781003139638-5" @default.
- W4280490634 hasPublicationYear "2022" @default.
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