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• W4280496862 endingPage "1589" @default.
• W4280496862 startingPage "1589" @default.
• W4280496862 abstract "DC–DC converter fault diagnosis, executed via neural networks built by exploiting the information deriving from testability analysis, is the subject of this paper. The networks under consideration are complex valued neural networks (CVNNs), whose fundamental feature is the proper treatment of the phase and the information contained in it. In particular, a multilayer neural network based on multi-valued neurons (MLMVN) is considered. In order to effectively design the network, testability analysis is exploited. Two possible ways for executing this analysis on DC–DC converters are proposed, taking into account the single-fault hypothesis. The theoretical foundations and some applicative examples are presented. Computer programs, based on symbolic analysis techniques, are used for both the testability analysis and the neural network training phase. The obtained results are very satisfactory and demonstrate the optimal performances of the method." @default.
• W4280496862 created "2022-05-22" @default.
• W4280496862 creator A5007810132 @default.
• W4280496862 creator A5008924460 @default.
• W4280496862 creator A5021219850 @default.
• W4280496862 creator A5074559814 @default.
• W4280496862 creator A5078187048 @default.
• W4280496862 date "2022-05-16" @default.
• W4280496862 modified "2023-09-27" @default.
• W4280496862 title "Testability Evaluation in Time-Variant Circuits: A New Graphical Method" @default.
• W4280496862 cites W1921754142 @default.
• W4280496862 cites W1955340979 @default.
• W4280496862 cites W1975773564 @default.
• W4280496862 cites W1986402568 @default.
• W4280496862 cites W1994582184 @default.
• W4280496862 cites W2006149896 @default.
• W4280496862 cites W2008949992 @default.
• W4280496862 cites W2013095862 @default.
• W4280496862 cites W2025855399 @default.
• W4280496862 cites W2031230445 @default.
• W4280496862 cites W2048361500 @default.
• W4280496862 cites W2077598398 @default.
• W4280496862 cites W2081097129 @default.
• W4280496862 cites W2093095587 @default.
• W4280496862 cites W2101550795 @default.
• W4280496862 cites W2108921639 @default.
• W4280496862 cites W2110273585 @default.
• W4280496862 cites W2121821621 @default.
• W4280496862 cites W2139134478 @default.
• W4280496862 cites W2142066163 @default.
• W4280496862 cites W2151293953 @default.
• W4280496862 cites W2152013740 @default.
• W4280496862 cites W2169433174 @default.
• W4280496862 cites W2171360905 @default.
• W4280496862 cites W2468082373 @default.
• W4280496862 cites W2559095063 @default.
• W4280496862 cites W2571767508 @default.
• W4280496862 cites W2746473826 @default.
• W4280496862 cites W2838005699 @default.
• W4280496862 cites W2946498058 @default.
• W4280496862 cites W2985671154 @default.
• W4280496862 cites W3125176639 @default.
• W4280496862 cites W1973987752 @default.
• W4280496862 doi "https://doi.org/10.3390/electronics11101589" @default.
• W4280496862 hasPublicationYear "2022" @default.
• W4280496862 type Work @default.
• W4280496862 citedByCount "3" @default.
• W4280496862 countsByYear W42804968622022 @default.
• W4280496862 countsByYear W42804968622023 @default.
• W4280496862 crossrefType "journal-article" @default.
• W4280496862 hasAuthorship W4280496862A5007810132 @default.
• W4280496862 hasAuthorship W4280496862A5008924460 @default.
• W4280496862 hasAuthorship W4280496862A5021219850 @default.
• W4280496862 hasAuthorship W4280496862A5074559814 @default.
• W4280496862 hasAuthorship W4280496862A5078187048 @default.
• W4280496862 hasBestOaLocation W42804968621 @default.
• W4280496862 hasConcept C113775141 @default.
• W4280496862 hasConcept C119599485 @default.
• W4280496862 hasConcept C127313418 @default.
• W4280496862 hasConcept C127413603 @default.
• W4280496862 hasConcept C138885662 @default.
• W4280496862 hasConcept C154945302 @default.
• W4280496862 hasConcept C165205528 @default.
• W4280496862 hasConcept C165801399 @default.
• W4280496862 hasConcept C175551986 @default.
• W4280496862 hasConcept C200601418 @default.
• W4280496862 hasConcept C24326235 @default.
• W4280496862 hasConcept C2776401178 @default.
• W4280496862 hasConcept C2778422915 @default.
• W4280496862 hasConcept C32946077 @default.
• W4280496862 hasConcept C41008148 @default.
• W4280496862 hasConcept C41895202 @default.
• W4280496862 hasConcept C50644808 @default.
• W4280496862 hasConcept C51234621 @default.
• W4280496862 hasConceptScore W4280496862C113775141 @default.
• W4280496862 hasConceptScore W4280496862C119599485 @default.
• W4280496862 hasConceptScore W4280496862C127313418 @default.
• W4280496862 hasConceptScore W4280496862C127413603 @default.
• W4280496862 hasConceptScore W4280496862C138885662 @default.
• W4280496862 hasConceptScore W4280496862C154945302 @default.
• W4280496862 hasConceptScore W4280496862C165205528 @default.
• W4280496862 hasConceptScore W4280496862C165801399 @default.
• W4280496862 hasConceptScore W4280496862C175551986 @default.
• W4280496862 hasConceptScore W4280496862C200601418 @default.
• W4280496862 hasConceptScore W4280496862C24326235 @default.
• W4280496862 hasConceptScore W4280496862C2776401178 @default.
• W4280496862 hasConceptScore W4280496862C2778422915 @default.
• W4280496862 hasConceptScore W4280496862C32946077 @default.
• W4280496862 hasConceptScore W4280496862C41008148 @default.
• W4280496862 hasConceptScore W4280496862C41895202 @default.
• W4280496862 hasConceptScore W4280496862C50644808 @default.
• W4280496862 hasConceptScore W4280496862C51234621 @default.
• W4280496862 hasIssue "10" @default.
• W4280496862 hasLocation W42804968621 @default.
• W4280496862 hasLocation W42804968622 @default.
• W4280496862 hasOpenAccess W4280496862 @default.
• W4280496862 hasPrimaryLocation W42804968621 @default.
• W4280496862 hasRelatedWork W1943209565 @default.

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