FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4281988648> ?p ?o ?g. }

• W4281988648 endingPage "100183" @default.
• W4281988648 startingPage "100183" @default.
• W4281988648 abstract "Manufacturing defects are one of the main causes of internal short circuits (ISCs) and then lead to thermal runaway accidents of batteries, which seriously threatens the safety of electric vehicles. Cu particle contaminants are one of the most common and dangerous manufacturing defects. Cu particles that may cause ISC by dissolving on the cathode and precipitating on the anode are smaller in size and less likely to be detected during manufacturing, compared with those that cause ISC by directly piercing the separator. However, there is little research on the mechanism and evaluation of ISC caused by cathode Cu particle contaminants. In this paper, Cu particles were intentionally placed on the cathode of lithium-ion batteries (LIBs). The mechanism and type of ISC induced by the Cu dissolution-precipitation process in LIBs were successfully characterized for the first time, and the evolution process was concluded. The ISC introduced by Cu particles was successfully simulated by a pseudo three-dimensional model. And the size boundary of Cu particles causing ISC was also studied. It was found that the implanted Cu particles will necessarily cause ISC in the batteries. The key to the ISC caused by cathode Cu particles is the precipitation of Cu along the pores of the separator from the anode side to the cathode side. The type of ISC caused by this defect is a cathode-anode short circuit, which only induces a soft ISC. The maximum temperature of the battery with this defect can only increase by approximately 2 °C through the calculation of the model under the set conditions of this study, which would not cause thermal runaway of the battery. In addition, even when the size is as small as 20 μm, the cathode Cu particle contaminants will still cause an ISC with short-circuit resistance of tens of kΩ magnitude." @default.
• W4281988648 created "2022-06-13" @default.
• W4281988648 creator A5000387236 @default.
• W4281988648 creator A5001533541 @default.
• W4281988648 creator A5006050935 @default.
• W4281988648 creator A5006111469 @default.
• W4281988648 creator A5030125450 @default.
• W4281988648 creator A5040184889 @default.
• W4281988648 creator A5045004059 @default.
• W4281988648 creator A5083736034 @default.
• W4281988648 creator A5087258774 @default.
• W4281988648 creator A5089786156 @default.
• W4281988648 date "2022-08-01" @default.
• W4281988648 modified "2023-10-14" @default.
• W4281988648 title "A comprehensive research on internal short circuits caused by copper particle contaminants on cathode in lithium-ion batteries" @default.
• W4281988648 cites W2022210469 @default.
• W4281988648 cites W2068145555 @default.
• W4281988648 cites W2094277544 @default.
• W4281988648 cites W2281997572 @default.
• W4281988648 cites W2306196689 @default.
• W4281988648 cites W2525866438 @default.
• W4281988648 cites W2781628553 @default.
• W4281988648 cites W2801929616 @default.
• W4281988648 cites W2808011319 @default.
• W4281988648 cites W2847489698 @default.
• W4281988648 cites W2889703183 @default.
• W4281988648 cites W2898894272 @default.
• W4281988648 cites W2934209811 @default.
• W4281988648 cites W2986053717 @default.
• W4281988648 cites W2990529256 @default.
• W4281988648 cites W2991547212 @default.
• W4281988648 cites W3012453318 @default.
• W4281988648 cites W3016755993 @default.
• W4281988648 cites W3106880287 @default.
• W4281988648 cites W3167879539 @default.
• W4281988648 cites W3194947068 @default.
• W4281988648 cites W3205125745 @default.
• W4281988648 cites W3211103177 @default.
• W4281988648 cites W4200552261 @default.
• W4281988648 doi "https://doi.org/10.1016/j.etran.2022.100183" @default.
• W4281988648 hasPublicationYear "2022" @default.
• W4281988648 type Work @default.
• W4281988648 citedByCount "10" @default.
• W4281988648 countsByYear W42819886482022 @default.
• W4281988648 countsByYear W42819886482023 @default.
• W4281988648 crossrefType "journal-article" @default.
• W4281988648 hasAuthorship W4281988648A5000387236 @default.
• W4281988648 hasAuthorship W4281988648A5001533541 @default.
• W4281988648 hasAuthorship W4281988648A5006050935 @default.
• W4281988648 hasAuthorship W4281988648A5006111469 @default.
• W4281988648 hasAuthorship W4281988648A5030125450 @default.
• W4281988648 hasAuthorship W4281988648A5040184889 @default.
• W4281988648 hasAuthorship W4281988648A5045004059 @default.
• W4281988648 hasAuthorship W4281988648A5083736034 @default.
• W4281988648 hasAuthorship W4281988648A5087258774 @default.
• W4281988648 hasAuthorship W4281988648A5089786156 @default.
• W4281988648 hasConcept C111368507 @default.
• W4281988648 hasConcept C119599485 @default.
• W4281988648 hasConcept C121332964 @default.
• W4281988648 hasConcept C127313418 @default.
• W4281988648 hasConcept C127413603 @default.
• W4281988648 hasConcept C145148216 @default.
• W4281988648 hasConcept C147789679 @default.
• W4281988648 hasConcept C163258240 @default.
• W4281988648 hasConcept C165801399 @default.
• W4281988648 hasConcept C17525397 @default.
• W4281988648 hasConcept C178790620 @default.
• W4281988648 hasConcept C185004128 @default.
• W4281988648 hasConcept C185592680 @default.
• W4281988648 hasConcept C191897082 @default.
• W4281988648 hasConcept C192562407 @default.
• W4281988648 hasConcept C2778517922 @default.
• W4281988648 hasConcept C2779197387 @default.
• W4281988648 hasConcept C42360764 @default.
• W4281988648 hasConcept C49110097 @default.
• W4281988648 hasConcept C544778455 @default.
• W4281988648 hasConcept C555008776 @default.
• W4281988648 hasConcept C62520636 @default.
• W4281988648 hasConcept C68583231 @default.
• W4281988648 hasConcept C72688512 @default.
• W4281988648 hasConcept C88380143 @default.
• W4281988648 hasConcept C89395315 @default.
• W4281988648 hasConcept C97355855 @default.
• W4281988648 hasConceptScore W4281988648C111368507 @default.
• W4281988648 hasConceptScore W4281988648C119599485 @default.
• W4281988648 hasConceptScore W4281988648C121332964 @default.
• W4281988648 hasConceptScore W4281988648C127313418 @default.
• W4281988648 hasConceptScore W4281988648C127413603 @default.
• W4281988648 hasConceptScore W4281988648C145148216 @default.
• W4281988648 hasConceptScore W4281988648C147789679 @default.
• W4281988648 hasConceptScore W4281988648C163258240 @default.
• W4281988648 hasConceptScore W4281988648C165801399 @default.
• W4281988648 hasConceptScore W4281988648C17525397 @default.
• W4281988648 hasConceptScore W4281988648C178790620 @default.
• W4281988648 hasConceptScore W4281988648C185004128 @default.
• W4281988648 hasConceptScore W4281988648C185592680 @default.
• W4281988648 hasConceptScore W4281988648C191897082 @default.
• W4281988648 hasConceptScore W4281988648C192562407 @default.

• next